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110711s2011 nyua ob 001 0 eng |
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|z 9781441993762
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|z 9781489990556
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|a 9781283351034 (online)
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|a 9781441993779 (online)
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|a (EBZ)ebs930913e
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|a DLC
|b eng
|d EBZ
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|a pcc
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|a TK7871.99.M44
|b B49 2011
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100 |
1 |
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|a Bhushan, Manjul.
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245 |
1 |
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|a Microelectronic test structures for CMOS technology
|h [electronic resource] /
|c Manjul Bhushan, Mark B. Ketchen.
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264 |
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1 |
|a New York :
|b Springer,
|c [2011]
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504 |
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|a Includes bibliographical references and index.
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650 |
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|a Metal oxide semiconductors, Complementary
|x Testing.
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700 |
1 |
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|a Ketchen, Mark B.
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773 |
0 |
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|t Springer Engineering eBooks 2011 English/International
|d Springer Nature
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776 |
1 |
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|t Microelectronic test structures for CMOS technology /
|w (DLC)2011934043
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856 |
4 |
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|3 Full text available
|z Available in Springer Engineering eBooks 2011 English/International.
|u https://ezproxy.wellesley.edu/login?url=https://link.springer.com/10.1007/978-1-4419-9377-9
|