CMOS Test and Evaluation A Physical Perspective /

CMOS Test and Evaluation A Physical Perspective /

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...

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Bibliographic Details
Authors / Creators: Bhushan, Manjul. (Author, http://id.loc.gov/vocabulary/relators/aut), Ketchen, Mark B. (http://id.loc.gov/vocabulary/relators/aut)
Other Authors / Creators:Ketchen, Mark B. author.
Other Corporate Authors / Creators:SpringerLink (Online service)
Format: Electronic eBook
Language:English
Edition:1st ed. 2015.
Imprint: New York, NY : Springer New York : Imprint: Springer, 2015.
Subjects:
Electronics.
Electronic circuits.
Semiconductors.
Security systems.
Electronics and Microelectronics, Instrumentation.
Electronic Circuits and Systems.
Security Science and Technology.
Online Access:Available in Springer Engineering eBooks 2015 English/International.

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Available in Springer Engineering eBooks 2015 English/International. Full text available

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